VLSI test principles and architectures design for testability /

Saved in:
Bibliographic Details
Other Authors: Wang, Laung-Terng., Wu, Cheng-Wen, EE Ph. D., Wen, Xiaoqing.
Format: eBook
Published: Amsterdam ; Boston : Elsevier Morgan Kaufmann Publishers, c2006.
Series:Morgan Kaufmann series in systems on silicon.
Online Access:Subscribed ebook (available only in University campus-wide network);click to view
Tags: Add Tag
No Tags, Be the first to tag this record!