VLSI test principles and architectures design for testability /

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Bibliographic Details
Other Authors: Wang, Laung-Terng., Wu, Cheng-Wen, EE Ph. D., Wen, Xiaoqing.
Format: eBook
Language:English
Published: Amsterdam ; Boston : Elsevier Morgan Kaufmann Publishers, c2006.
Series:Morgan Kaufmann series in systems on silicon.
Subjects:
Online Access:Subscribed ebook (available only in University campus-wide network);click to view
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