Holdings: VLSI test principles and architectures

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Bibliographic Details
Other Authors:	Wang, Laung-Terng., Wu, Cheng-Wen, EE Ph. D., Wen, Xiaoqing.
Format:	eBook
Language:	English
Published:	Amsterdam ; Boston : Elsevier Morgan Kaufmann Publishers, c2006.
Series:	Morgan Kaufmann series in systems on silicon.
Subjects:	Integrated circuits > Very large scale integration > Testing. Integrated circuits > Very large scale integration > Design. Electronic books.
Online Access:	Subscribed ebook (available only in University campus-wide network);click to view
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